Make and Model:

FEI Nova 450 NanoSEM

Description:
SEM is used to study topography, morphology and local chemical and phase composition from nanometers to millimeters. The Nova NanoSEM 450 field-emission scanning electron microscope (FE-SEM) delivers best-in-class imaging and analytical performance in a single, easy-to-use instrument and enables you to gain the most comprehensive answers in the least amount of time.

Standard Detectors:
    •    Everhart-Thornley Detector (ETD) 
    •    Through Lens Detector (TLD)

Advanced Detectors:
    •    Concentric Backscattered Detector (CBS)
    •    Scanning Transmission Electron Detector (STEM)
    •    Low Vacuum Detector (LVD)

Added Capabilities:
    •    Energy Dispersive X-ray Spectroscopy
    •    E-beam Lithography

** SBASSE Central Labs Facility

Contact:
Dr. Salman N. Arshad (salman.arshad@lums.edu.pk) 
Dr. Irshad Hussain (ihussain@lums.edu.pk) 
Dr. Falak Sher (fsher@lums.edu.pk) 
Dr. Habib Ur Rehman (habib.rehman@lums.edu.pk)