Transmission Electron Microscopy: a versatile technique for characterizing the nanomaterials
Speaker: Dr. Dalaver H. Anjum
PhD. Department of Physics, Khalifa University, Abu Dhabi, UAE
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Dr. Dalaver H. Anjum received his PhD Degree in Physics in the year of 2002 from the University at Albany-Sate University of New York, Albany, New York, USA. Currently, he is working as an Assistant Professor in the Department of Physics of Khalifa University, Abu Dhabi, UAE. His main research interests include characterizing the structure and properties of materials at nanoscales by using TEM. Overall, he has the experience of carrying out the TEM analysis of nanomaterials from both industry and academia. He has authored/co-authored 245 publications spanning various fields of Science & Engineering including Materials Science, Electronics & Photonics, Catalysis, Bioscience, Energy-Storage, Solar Cell, Polymer Science, and Water Desalination.